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    ITC 55100STD

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    半導(dǎo)體測(cè)試設(shè)備-電學(xué)性能測(cè)試

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     The ITC55100STD is a single site 100A version of the industry standard series of ITC55100 testers. The ITC55100STD performs all the same tests as the ITC55100 system but has a single test port and a maximum drain current capability of 100A for improved price/performance in single DUT production testing applications.

    Model ITC55100STD performs ruggedness testing of power MOSFETs and IGBTs. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.

    The ITC55100STD performs several types of tests that conform to MIL-STD-750C Method 3470. Method 3470 tests the capability of P- and N-Channel MOSFETs and IGBTs by stressing them to controlled energy levels. This is accomplished by the devices driving an unclamped inductive load

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