網(wǎng)站首頁

|EN

當(dāng)前位置: 首頁 » 設(shè)備館 » 半導(dǎo)體測試設(shè)備 » 壽命測試設(shè)備 » 老化電源系統(tǒng) »ITC 52300
    包郵 關(guān)注:506

    ITC 52300

    庫       存:

    111111

    產(chǎn)       地:

    全國

    數(shù)       量:

    減少 增加

    價(jià)       格:

    面議
    交易保障 擔(dān)保交易 網(wǎng)銀支付
     The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)

    Testing meets the requirements of MIL-STD-750, Methods 1026.3, 1027.1, 1036.3, 1037, and 1042.1.
    once set up, the operation of the ITC52300 is fully automatic and can be operated around the clock without operator attention.

    Test devices plug into DUT boards that are plugged into power and monitoring circuits inside a chamber that can hold up to 16 different device test boards with a maximum of 80 devices per board.

    咨詢

    購買之前,如有問題,請向我們咨詢

    提問:
     

    應(yīng)用于半導(dǎo)體行業(yè)的相關(guān)同類產(chǎn)品:

    服務(wù)熱線

    4001027270

    功能和特性

    價(jià)格和優(yōu)惠

    微信公眾號(hào)