網(wǎng)站首頁

|EN

當(dāng)前位置: 首頁 » 設(shè)備館 » 半導(dǎo)體測試設(shè)備 » 其他測試設(shè)備類 »單長脈沖太陽能高效電池測試系統(tǒng)
    包郵 關(guān)注:306

    單長脈沖太陽能高效電池測試系統(tǒng)

    應(yīng)用于半導(dǎo)體行業(yè):

    半導(dǎo)體測試設(shè)備-其他測試設(shè)備類

    產(chǎn)品品牌

    OAI

    庫       存:

    10000

    產(chǎn)       地:

    全國

    數(shù)       量:

    減少 增加

    價       格:

    面議
    交易保障 擔(dān)保交易 網(wǎng)銀支付
    • 商品詳情
    • 商品參數(shù)
    • 評價詳情(0)
    • 裝箱清單
    • 售后保障

    品牌:OAI

    型號:

    所屬系列:半導(dǎo)體測試設(shè)備-其他測試設(shè)備類

     

     單長脈沖太陽能高效電池測試系統(tǒng)

    OAI單脈沖太陽能模擬器和I-V測試系統(tǒng)是專為高效太陽能電池設(shè)計(jì)的。該測試系統(tǒng)通過提供高度優(yōu)化的脈沖寬度和電壓掃描速率來克服閃存測試的限制,以匹配電池的電介質(zhì)響應(yīng)速度。因此,該系統(tǒng)產(chǎn)生太陽能電池效率的非常精確的測量,導(dǎo)致更準(zhǔn)確的分箱和增加的盈利能力。

    單晶Si,多晶Si,HIT和背面接觸型太陽能電池設(shè)計(jì)的進(jìn)展已導(dǎo)致電池電容和電阻增加大于2個數(shù)量級。這導(dǎo)致電池的電介質(zhì)響應(yīng)速度的降低。大多數(shù)閃光測試儀提供極短的脈沖持續(xù)時間,并且需要快速的電壓掃描速率。通過使用閃光測試儀測試太陽能電池,結(jié)果可能產(chǎn)生不一致的填充因子值和較低的電池效率測量。

     

    高效率電池需要約75-200ms的脈沖寬度和<15V /秒的電壓掃描速率的工作范圍,這為閃存測試系統(tǒng)準(zhǔn)確地確定這些先進(jìn)電池的性能造成了重大挑戰(zhàn)。 OAI的新型單脈沖太陽能模擬器和I-V測試系統(tǒng)克服了這些限制,并為高效太陽能電池提供了非常準(zhǔn)確的測量。該測試系統(tǒng)適用于研發(fā)和生產(chǎn),通過提供優(yōu)化的長脈沖寬度和電壓掃描速率以及獨(dú)特的算法,解決了高效率和高電容太陽能電池獨(dú)特的測量挑戰(zhàn)。結(jié)果是I&V曲線的準(zhǔn)確測量以及確定太陽能電池的真實(shí)填充因子和效率的能力。

    Single Long Pulse Solar Test System for High Efficiency Cells

    The OAI Single Long Pulse Solar Simulator and I–V Test System is designed specifically for High Efficiency Solar Cells. This test system overcomes the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match the cell's dielectric response speed. As a result, the system produces extremely precise measurements of solar cell efficiency leading to more accurate binning and increased profitability.

    Advances in mono-crystalline Si, multi–crystalline Si, HIT, and backside–contact type based solar cell design have led to an increase in cell capacitance and resistance by >2 orders of magnitude. This results in a decrease in the cell's dielectric response speed. Most flash testers provide extremely short pulse duration, and require fast voltage sweep rates. By testing solar cells with flash testers, the results can give inconsistent fill-factor values and lower cell efficiency measurements.

    High Efficiency Cells require a pulse width in the range of ˜ 75–200ms and a working range of <15V/sec voltage sweep rates, creating a significant challenge for flash test systems to accurately determine the performance of these advanced cells. OAI's new Single Long Pulse Solar Simulator & I–V Test System overcomes these limitations and provides exceptionally accurate measurements for High Efficiency Solar Cells. Perfect for both R&D and production, this test system solves the unique measurement challenges of High Efficiency and High Capacitance Solar Cells by providing an optimized long pulse width and voltage sweep rate combined with a unique algorithm. The result is accurate measurement of the I&V curve and the ability to ascertain the true fill-factor and efficiency of a solar cell. 

    咨詢

    購買之前,如有問題,請向我們咨詢

    提問:
     

    應(yīng)用于半導(dǎo)體行業(yè)的相關(guān)同類產(chǎn)品:

    服務(wù)熱線

    4001027270

    功能和特性

    價格和優(yōu)惠

    微信公眾號